Compositional Analysis and Evolution of Defects Formed on Gainp Epilayers Grown on Germanium

AuthID
 P-003-MCM
7
Author(s)
Galiana, B
·
Barrigon, E
·
Espinet, P
·
Tipo de Documento
Article
Year published
2009
Publicado
in SUPERLATTICES AND MICROSTRUCTURES, ISSN: 0749-6036
Volume: 45, Número: 4-5, Páginas: 277-284 (8)
Conference
9Th International Workshop on Beam Injection Assessment of Microstructure in Semiconductors, Date: JUN 29-JUL 03, 2008-2009, Location: Toledo, SPAIN
Indexing
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Scopus®
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Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-62949092695
Wos: WOS:000265544400021
Source Identifiers
ISSN: 0749-6036
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