PICOSEC-MICROMEGAS: Robustness Measurements and Study of Different Photocathode Materials

AuthID
P-014-E6A
42
Author(s)
Sohl, L
·
Bortfeldt, J
·
Brunbauer, F
·
David, C
·
Desforge, D
·
Fanourakis, G
·
Franchi, J
·
García, F
·
Giomataris, I
·
[+22]·
Scorsone, E
·
van Stenis, M
·
Thuiner, P
·
Tsipolitis, Y
·
Tzamarias, SE
·
Veenhof, R
·
Wang, X
·
White, S
·
Zhang, Z
·
Zhou, Y
Tipo de Documento
Article
Year published
2019
Publicado
in Journal of Physics: Conference Series, ISSN: 1742-6588
Volume: 1312, Número: 1, Páginas: 012012
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Source Identifiers
ISSN: 1742-6588
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Name Order Nome   Name Order Nome   Name Order Nome
1 Sohl, L;   2 Bortfeldt, J;   3 Brunbauer, F;
4 David, C;   5 Desforge, D;   6 Fanourakis, G;
7 Franchi, J;   8 Gallinaro, M;   9 García, F;
10 Giomataris, I;   11 González-Díaz, D;   12 Gustavsson, T;
13 Guyot, C;   14 Iguaz, FJ;   15 Kebbiri, M;
16 Kordas, K;   17 Legou, P;   18 Liu, J;
19 Lupberger, M;   20 Manthos, I;   21 Müller, H;
22 Niaouris, V;   23 Oliveri, E;   24 Papaevangelou, T;
25 Paraschou, K;   26 Pomorski, M;   27 Qi, B;
28 Resnati, F;   29 Ropelewski, L;   30 Sampsonidis, D;
31 Schneider, T;   32 Schwemling, P;   33 Scorsone, E;
34 van Stenis, M;   35 Thuiner, P;   36 Tsipolitis, Y;
37 Tzamarias, SE;   38 Veenhof, R;   39 Wang, X;
40 White, S;   41 Zhang, Z;   42 Zhou, Y;