Two-Probe Electrical Measurements in Transmission Electron Microscopes-Behavioral Control of Tungsten Microwires

AuthID
 P-003-NKH
9
Author(s)
Fang, XS
·
Wang, SL
·
He, YH
·
Huang, H
·
Tipo de Documento
Article
Year published
2009
Publicado
in MICROSCOPY RESEARCH AND TECHNIQUE, ISSN: 1059-910X
Volume: 72, Número: 2, Páginas: 93-100 (8)
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Publication Identifiers
Pubmed: 18837439
SCOPUS: 2-s2.0-59949083742
Wos: WOS:000263511100006
Source Identifiers
ISSN: 1059-910X
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