Pavese, F; Bar, M; Forbes, AB; Linares, JM; Perruchet, C; Zhang, NF
Tipo de Documento
Proceedings Paper
Year published
2009
Publicado
in ADVANCED MATHEMATICAL AND COMPUTATIONAL TOOLS IN METROLOGY AND TESTING VIII in Series on Advances in Mathematics for Applied Sciences, ISSN: 1793-0901
Volume: 78, Páginas: 273-278 (6)
Conference
International Conference on Advanced Mathematical and Computational Tool in Metrology and Testing, Date: JUN, 2008, Location: Paris, FRANCE, Host: IMEKO Tech Comm
