Simultaneous and Independent Determination of Refractive Index and Thickness of Thin Films by Ellipsometry

AuthID
 P-014-YVR
4
Author(s)
VEDAM, K
·
LUKES, F
·
SRINIVASAN, R
Tipo de Documento
Article
Year published
1968
Publicado
in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, ISSN: 0030-3941
Volume: 58, Número: 4, Páginas: 526-+ (1)
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Publication Identifiers
Wos: WOS:A1968A991300015
Source Identifiers
ISSN: 0030-3941
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