Specific Site Cross-Sectional Sample Preparation Using Focused Ion Beam for Transmission Electron Microscopy

AuthID
 P-014-YY7
2
Author(s)
Schraub, DM
·
Tipo de Documento
Review
Year published
1998
Publicado
in PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS, ISSN: 0146-3535
Volume: 36, Número: 1-2, Páginas: 99-122 (24)
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Publication Identifiers
Wos: WOS:000074599200002
Source Identifiers
ISSN: 0146-3535
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