Simultaneous and Independent Determination of the Refractive Index and the Thickness of Thin Films by Ellipsometry*

AuthID
 P-014-Z13
4
Author(s)
Vedam, K
·
Lukes, F
·
Srinivasan, R
Tipo de Documento
Article
Year published
1968
Publicado
in Journal of the Optical Society of America, ISSN: 0030-3941
Volume: 58, Número: 4, Páginas: 526
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Source Identifiers
ISSN: 0030-3941
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