On the Efficient Reduction of Complete Em Based Parametric Models

AuthID
P-003-PN3
4
Author(s)
Villena, JF
·
Ciuprina, G
·
Ioan, D
·
Tipo de Documento
Proceedings Paper
Year published
2009
Publicado
in DATE: 2009 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION, VOLS 1-3 in Design Automation and Test in Europe Conference and Expo, ISSN: 1530-1591
Páginas: 1172-1177 (6)
Conference
Design, Automation and Test in Europe Conference and Exhibition, Date: APR 20-24, 2009, Location: Nice, FRANCE, Patrocinadores: European Design and Automation Association;EDA Consortium;IEEE Computer Society TTTC;IEEE Council on Electronic Design Automation, CEDA;ECSI
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-70350064436
Wos: WOS:000273246700208
Source Identifiers
ISSN: 1530-1591
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Info
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