Application of Genetic Algorithms for Estimation of Impedance Parameters of Two-Terminal Networks

AuthID
 P-003-Q9W
2
Author(s)
Tipo de Documento
Proceedings Paper
Year published
2009
Publicado
in I2MTC: 2009 IEEE INSTRUMENTATION & MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-3 in IEEE Instrumentation and Measurement Technology Conference, ISSN: 1091-5281
Páginas: 578-582 (5)
Conference
26Th Ieee International Instrumentation and Measurement Technology Conference, Date: MAY 05-07, 2009, Location: Singapore, SINGAPORE, Patrocinadores: IEEE Instrumentat & Measurement Soc, IEEE Singapore Sect, Singapore Polytechn
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Publication Identifiers
SCOPUS: 2-s2.0-70450067821
Wos: WOS:000277153600116
Source Identifiers
ISSN: 1091-5281
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