Laminar Analysis Of Thin-Film Samples By The Mass-Spectrometry Technique Of Secondary Ions With Additional Registration Of Current Sample

AuthID
 P-015-BY8
2
Author(s)
KITAEVA, TI
Tipo de Documento
Article
Year published
1994
Publicado
in PISMA V ZHURNAL TEKHNICHESKOI FIZIKI, ISSN: 0320-0116
Volume: 20, Número: 16, Páginas: 37-39 (3)
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Wos®
Publication Identifiers
Wos: WOS:A1994PU16200007
Source Identifiers
ISSN: 0320-0116
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