Microscopic Characterization of Devices by Scanning Transmission Electron Microscopy: From Single Atom Imaging to Macroscopic Properties

AuthID
 P-015-CBR
4
Author(s)
Pennycook, SJ
·
Benthem, Kv
·
Pantelides, ST
Tipo de Documento
Proceedings Paper
Year published
2009
Publicado
in Extended Abstracts of the 2009 International Conference on Solid State Devices and Materials
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