Surface And Thin Film Analysis Using Grazing Incidence Fast Atom Diffraction (Gifad)

AuthID
 P-015-DYX
4
Author(s)
Khemliche, H
·
Soulisse, P
·
Roncin, P
3
Editor(es)
Malovic,G;Popovic,LC;Dimitrijevic,MS
Tipo de Documento
Proceedings Paper
Year published
2008
Publicado
in 24TH SUMMER SCHOOL AND INTERNATIONAL SYMPOSIUM ON THE PHYSICS OF IONIZED GASES, CONTRIBUTED PAPERS, ISSN: 0373-3742
Número: 84, Páginas: 142-142 (1)
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Wos®
Publication Identifiers
Wos: WOS:000269314500032
Source Identifiers
ISSN: 0373-3742
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