Confirmation of Incorporation of Cu and Se Ions in Applied P- and N-Type-Doped Sb2S3 by Photoemission Spectroscopy

AuthID
 P-015-DZ3
5
Author(s)
Validzic, IL
·
Popovic, M
·
Lojpur, V
·
Rakocevic, Z
Tipo de Documento
Article
Year published
2018
Publicado
in JOURNAL OF ELECTRONIC MATERIALS, ISSN: 0361-5235
Volume: 47, Número: 4, Páginas: 2402-2410 (9)
Indexing
Wos®
Google Scholar®
Publication Identifiers
Wos: WOS:000426586000028
Source Identifiers
ISSN: 0361-5235
Export Publication Metadata
Lista Marked
 Adicionar à lista Marked
Info
At this moment we don't have any links to full text documens.

Um espaço para investigadores e suas Instituições

Links Úteis

Ajuda

© 2025 CRACS & Inesc TEC - All Rights Reserved Política de Privacidade | Terms of Service