Absolute Scale Reciprocal Space Mapping on X-Ray Diffractometers Incorporating a Position Sensitive Detector: Application to Iii-Nitride Semiconductors

AuthID
 P-000-C20
3
Author(s)
Sequeira, AD
4
Editor(es)
Martins, R; Fortunato, E; Ferreira, I; Dias, C
Tipo de Documento
Article
Year published
2004
Publicado
in ADVANCED MATERIALS FORUM II in MATERIALS SCIENCE FORUM, ISSN: 0255-5476
Volume: 455-456, Páginas: 132-136 (5)
Conference
2Nd International Materials Symposium, Date: APR 14-16, 2003, Location: Caparica, PORTUGAL, Patrocinadores: Portuguese Mat Soc, Portuguese Sci Fdn, Calouste Gulbenkian Fdn, Luso Amer Fdn, Host: New Univ Lisbon, Fac Sci & Technol
Indexing
Wos®
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-3142749045
Wos: WOS:000222018500029
Source Identifiers
ISSN: 0255-5476
Export Publication Metadata
Lista Marked
 Adicionar à lista Marked
Info
At this moment we don't have any links to full text documens.

Um espaço para investigadores e suas Instituições

Links Úteis

Ajuda

© 2024 CRACS & Inesc TEC - All Rights Reserved Política de Privacidade | Terms of Service