Charging Effects in Cdse Nanocrystals Embedded in Sio2 Matrix Produced by Rf Magnetron Sputtering

AuthID
 P-003-TNZ
9
Author(s)
Basa, P
·
Horvath, ZJ
·
Tipo de Documento
Article
Year published
2008
Publicado
in MICROELECTRONIC ENGINEERING, ISSN: 0167-9317
Volume: 85, Número: 12, Páginas: 2374-2377 (4)
Conference
Symposium on Materials and Emerging Technologies for Non-Volatile-Memory Devices Held at the 2008 Emrs Spring Meeting, Date: MAY 26-30, 2008, Location: Strasbourg, FRANCE, Patrocinadores: European Mat Res Soc
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Publication Identifiers
SCOPUS: 2-s2.0-56649106475
Wos: WOS:000262460600013
Source Identifiers
ISSN: 0167-9317
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