A Spectroscopic Ellipsometry Study of Tio2:Zro2 on Tin/Si Thin Films Prepared by Chemical Beam Vapor Deposition

AuthID
 P-016-QJP
10
Author(s)
Agnihotri, P
·
Verma, A
·
Saini, A
·
Rani, R
·
Maudez, W
·
Wagner, E
·
Benvenuti, G
·
Banerjee, C
·
Dutta, M
·
Tipo de Documento
Article
Year published
2024
Publicado
in Surface and Interface Analysis, ISSN: 0142-2421
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ISSN: 0142-2421
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