Transmission Electron Microscopy Analysis of the Interfaces of Tialn/Mo Multilayers

AuthID
 P-003-WP7
4
Author(s)
Riviere, JP
·
Denanot, MF
Tipo de Documento
Editorial Material
Year published
2008
Publicado
in MICROSCOPY AND MICROANALYSIS, ISSN: 1431-9276
Volume: 14, Número: SUPPL. 3, Páginas: 1-4 (4)
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Publication Identifiers
SCOPUS: 2-s2.0-53349142265
Wos: WOS:000207534900001
Source Identifiers
ISSN: 1431-9276
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