Morphological and Structural Characterization of Oxidized La-Si Sputtered Thin Films

AuthID
 P-003-WPZ
2
Author(s)
Tipo de Documento
Editorial Material
Year published
2008
Publicado
in MICROSCOPY AND MICROANALYSIS, ISSN: 1431-9276
Volume: 14, Número: SUPPL. 3, Páginas: 81-84 (4)
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Scopus®
Crossref®3
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-53349175622
Wos: WOS:000207534900026
Source Identifiers
ISSN: 1431-9276
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