Characterization of Sputtered Shape Memory Alloy Ni-Ti Films by Cross-Sectional Tem and Sem

AuthID
 P-003-WQ0
6
Author(s)
Muecklich, A
·
Tipo de Documento
Editorial Material
Year published
2008
Publicado
in MICROSCOPY AND MICROANALYSIS, ISSN: 1431-9276
Volume: 14, Número: SUPPL. 3, Páginas: 85-86 (2)
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Scopus®
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Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-53349109548
Wos: WOS:000207534900027
Source Identifiers
ISSN: 1431-9276
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