The Influence of Electric Field on the Microstructure of Nc-Si : H Films Produced by Rf Magnetron Sputtering

AuthID
P-003-X2F
4
Author(s)
Thaiyalnayaki, V
·
Tipo de Documento
Article
Year published
2008
Publicado
in VACUUM, ISSN: 0042-207X
Volume: 82, Número: 12, Páginas: 1433-1436 (4)
Conference
5Th Iberian Vacuum Meeting, Date: SEP 18-21, 2005, Location: Guimaraes, PORTUGAL, Host: Univ Minho
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-49149129532
Wos: WOS:000259460300023
Source Identifiers
ISSN: 0042-207X
Export Publication Metadata
Info
At this moment we don't have any links to full text documens.