The Determination of the Metal-Dielectric Interface Barrier Height from the Open-Circuit Isothermal Charging Current

AuthID
 P-003-XBJ
5
Author(s)
Neagu, ER
·
Tipo de Documento
Article
Year published
2008
Publicado
in JOURNAL OF APPLIED PHYSICS, ISSN: 0021-8979
Volume: 104, Número: 3, Páginas: 034102 (6)
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Publication Identifiers
SCOPUS: 2-s2.0-49749084411
Wos: WOS:000258493900111
Source Identifiers
ISSN: 0021-8979
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