Structural, Magnetic, and Dielectric Properties of Laser-Ablated Cofe2O4/Batio3 Bilayers Deposited over Highly Doped Si(100)

AuthID
 P-017-K6K
12
Author(s)
Oliveira, J
·
Silva, BM
·
Rebelo, T
·
Rodrigues, PV
·
Rodrigues, MJLF
·
Lekshmi, N
·
Deepak, FL
·
Almeida, BG
Tipo de Documento
Article
Year published
2024
Publicado
in Materials
Volume: 17, Número: 23, Páginas: 5707
Indexing
Crossref®
Google Scholar®
Publication Identifiers
Export Publication Metadata
Lista Marked
 Adicionar à lista Marked
Info
At this moment we don't have any links to full text documens.

Um espaço para investigadores e suas Instituições

Links Úteis

Ajuda

© 2024 CRACS & Inesc TEC - All Rights Reserved Política de Privacidade | Terms of Service