Frequency-Dependent Electromechanical Response in Ferroelectric Materials Measured via Piezoresponse Force Microscopy

AuthID
P-000-CQF
5
Author(s)
Kim, SH
·
Herrero, JM
·
5
Editor(es)
HoffmannEifert, S; Funakubo, H; Joshi, V; Kingon, AI; Koutsaroff, IP
Tipo de Documento
Proceedings Paper
Year published
2004
Publicado
in FERROELECTRIC THIN FILMS XII in MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS, ISSN: 0272-9172
Volume: 784, Páginas: 83-88 (6)
Conference
Symposium on Ferroelectric Thin Films Xii Held at the 2003 Mrs Fall Meeting, Date: DEC 01-04, 2003, Location: Boston, MA, Patrocinadores: Mat Res Soc, AIXTRON AG, Gennum Corp, Kojundo Chem Lab Co Ltd, Symetrix Corp, Tegal Corp, ULVAC Inc
Indexing
Publication Identifiers
Wos: WOS:000222178100014
Source Identifiers
ISSN: 0272-9172
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