Effects of Temperature on the Fracture Response of Emc-Si Interface Found in Multilayer Semiconductor Components

AuthID
 P-017-T63
8
Author(s)
Valdoleiros, J
·
Akhavan-Safar, A
·
Maleki, P
·
Videira, PFC
·
Marques, EAS
·
Karunamurthy, B
·
Tipo de Documento
Article
Year published
2025
Publicado
in Surfaces
Volume: 8, Número: 1, Páginas: 2
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