Metal Contamination Detection in Nickel Induced Crystallized Silicon by Spectroscopic Ellipsometry

AuthID
 P-003-ZSF
6
Author(s)
Beckers, M
·
Tipo de Documento
Article
Year published
2008
Publicado
in JOURNAL OF NON-CRYSTALLINE SOLIDS, ISSN: 0022-3093
Volume: 354, Número: 19-25, Páginas: 2319-2323 (5)
Conference
22Nd International Conference on Amorphous and Nanocrystalline Semiconductors, Date: AUG 19-24, 2007, Location: Breckenridge, CO, Patrocinadores: Univ Toledo, PVIC, NREL, United Solar, Forschungszentrum Julich, Hewlett Packard, OptiSolar, PARC, Sanyo, Sharp
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Publication Identifiers
SCOPUS: 2-s2.0-43049138411
Wos: WOS:000256500400056
Source Identifiers
ISSN: 0022-3093
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