Combined Grazing Incidence Rbs and Tem Analysis of Luminescent Nano-Sige/Sio2 Multilayers

AuthID
 P-004-0NS
7
Author(s)
Ortiz, MI
·
Rodriguez, T
·
Ballesteros, C
·
Tipo de Documento
Article
Year published
2008
Publicado
in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ISSN: 0168-583X
Volume: 266, Número: 8, Páginas: 1397-1401 (5)
Conference
18Th International Conference on Ion Beam Analysis, Date: SEP 23-28, 2007, Location: Hyderabad, INDIA, Patrocinadores: Inter Univ Accelerator Ctr, Inst Phys, Host: Univ Hyderabad, Sch Phys
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Publication Identifiers
SCOPUS: 2-s2.0-43049154997
Wos: WOS:000256677600052
Source Identifiers
ISSN: 0168-583X
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