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X-Ray Characterization and Domain Structure of High-Quality Srbi2Ta2O9 Single-Crystals Grown by Self-Flux Solution Method

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P-000-CYP

Author(s)

Amorin, H

Tipo de Documento

Article

Year published

2004

Publicado

in INTEGRATED FERROELECTRICS, ISSN: 1058-4587

Volume: 68, Páginas: 259-268 (10)

Conference

16Th International Symposium on Integrated Ferroelectrics/5Th Korean Workshop on High Dielectric Devices and Materials, Date: APR 05-08, 2004, Location: Gyeongju, SOUTH KOREA

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Publication Identifiers

DOI: 10.1080/10584580490896616

SCOPUS: 2-s2.0-33751172350

Wos: WOS:000226090100028

Source Identifiers

ISSN: 1058-4587

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X-Ray Characterization and Domain Structure of High-Quality Srbi2Ta2O9 Single-Crystals Grown by Self-Flux Solution Method

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X-Ray Characterization and Domain Structure of High-Quality Srbi2Ta2O9 Single-Crystals Grown by Self-Flux Solution Method

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