Dual Frequency Sweeping Interferometry with Range-Invariant Accuracy for Absolute Distance Metrology

AuthID
 P-004-3M6
3
Author(s)
3
Editor(es)
Schmit, J; Creath, K; Towers, CE
Tipo de Documento
Proceedings Paper
Year published
2008
Publicado
in INTERFEROMETRY XIV: TECHNIQUES AND ANALYSIS in PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE), ISSN: 0277-786X
Volume: 7063
Conference
Conference on Interferometry Xiv - Techiques and Analysis, Date: AUG 11-13, 2008, Location: San Diego, CA, Patrocinadores: SPIE
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Publication Identifiers
SCOPUS: 2-s2.0-52249087527
Wos: WOS:000262082100028
Source Identifiers
ISSN: 0277-786X
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