Uncertainty Analysis of Impedance Measurements Using Dsp Implemented Ellipse Fitting Algorithms

AuthID
 P-004-59Z
4
Author(s)
Tipo de Documento
Proceedings Paper
Year published
2008
Publicado
in 2008 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5 in IEEE INSTRUMENTATION & MEASUREMENT TECHNOLOGY CONFERENCE, PROCEEDINGS, ISSN: 1091-5281
Páginas: 463-467 (5)
Conference
25Th Ieee Instrumentation and Measurement Technology Conference, Date: MAY 12-15, 2008, Location: Victoria, CANADA, Patrocinadores: IEEE Instrumentat & Measurement Soc
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Publication Identifiers
SCOPUS: 2-s2.0-51349161627
Wos: WOS:000261512100088
Source Identifiers
ISSN: 1091-5281
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