Standard Histogram Test Precision of Adc Gain and Offset Error Estimation

AuthID
 P-004-758
2
Author(s)
Tipo de Documento
Article
Year published
2007
Publicado
in IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, ISSN: 0018-9456
Volume: 56, Número: 5, Páginas: 1527-1531 (5)
Conference
22Nd Ieee Instrumentation and Measurement Technology Conference, Date: MAY 17-19, 2005, Location: Ottawa, CANADA, Patrocinadores: IEEE Instrumentat & Measurement Soc
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Publication Identifiers
SCOPUS: 2-s2.0-34648836347
Wos: WOS:000249619700003
Source Identifiers
ISSN: 0018-9456
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