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In-Situ Study of Ni-Ti Thin Film Growth on a Tin Intermediate Layer by X-Ray Diffraction

AuthID
P-004-7GA

Author(s)

Martins, RMS

Schell, N

Silva, RJC

Pereira, L

Mahesh, KK

Braz Fernandes, FMB

Tipo de Documento

Article

Year published

2007

Publicado

in SENSORS AND ACTUATORS B-CHEMICAL, ISSN: 0925-4005

Volume: 126, Número: 1, Páginas: 332-337 (6)

Conference

Symposium on Functional Materials for Micro and Nanosystems, Date: MAY 29-JUN 02, 2006, Location: Strasbourg, FRANCE, Patrocinadores: European Mat Res Soc

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Publication Identifiers

DOI: 10.1016/j.snb.2006.12.052

SCOPUS: 2-s2.0-34548474069

Wos: WOS:000250178800057

Source Identifiers

ISSN: 0925-4005

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In-Situ Study of Ni-Ti Thin Film Growth on a Tin Intermediate Layer by X-Ray Diffraction

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In-Situ Study of Ni-Ti Thin Film Growth on a Tin Intermediate Layer by X-Ray Diffraction

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