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Cryogenic Si Detectors for Ultra Radiation Hardness in Slhc Environment
AuthID
P-004-80B
P-004-80B
53
Author(s)
Li, Z
··
Anbinderis, P
·Anbinderis, T
·Ambrosio, NU
·[+7]·
[+7]·
[+2]·
[+2]·
[+1]·
[+1]·
[+2]·
[+4]·
[+7]·
Verbitskaya, E
·Wobst, E
·Zavrtanik, M
Tipo de Documento
Article
Year published
2007
Publicado
in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, ISSN: 0168-9002
Volume: 579, Número: 2, Páginas: 775-781 (7)
Conference
6Th International Symposium on Development and Application of Semiconductor Tracking Detectors, Date: SEP 11-15, 2006, Location: Carmel, CA
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Source Identifiers
ISSN: 0168-9002
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| Name Order | Nome | Name Order | Nome | Name Order | Nome | ||
|---|---|---|---|---|---|---|---|
| 1 | Li, Z; | 2 | Abreu, M ; | 3 | Anbinderis, P; | ||
| 4 | Anbinderis, T; | 5 | Ambrosio, NU; | 6 | de Boer, W; | ||
| 7 | Borchi, E; | 8 | Borer, K; | 9 | Bruzzi, M; | ||
| 10 | Buontempo, S; | 11 | Chen, W; | 12 | Cindro, V; | ||
| 13 | Dierlamm, A; | 14 | Eremin, V; | 15 | Gaubas, E; | ||
| 16 | Gorbatenko, V; | 17 | Grigoriev, E; | 18 | Hauler, F; | ||
| 19 | Heijne, E; | 20 | Heising, S; | 21 | Hempel, O; | ||
| 22 | Herzog, R; | 23 | Harkonen, J; | 24 | Ilyashenko, I; | ||
| 25 | Janos, S; | 26 | Jungermann, L; | 27 | Kalesinskas, V; | ||
| 28 | Kapturauskas, J; | 29 | Laiho, R; | 30 | Luukka, P; | ||
| 31 | Mandic, I; | 32 | De Masio, R; | 33 | Menichelli, D; | ||
| 34 | Mikuz, M; | 35 | Militaru, O; | 36 | Niinikosky, TO; | ||
| 37 | Shea, VO; | 38 | Pagano, S; | 39 | Paul, S; | ||
| 40 | Piotrzkowski, K; | 41 | Pretzl, K; | 42 | Mendes, PR; | ||
| 43 | Rouby, X; | 44 | Ruggiero, G; | 45 | Smith, K; | ||
| 46 | Sonderegger, P; | 47 | Sousa, P; | 48 | Tuominen, E; | ||
| 49 | Tuovinen, E; | 50 | Verbitskaya, E; | 51 | Vaitkus, J; | ||
| 52 | Wobst, E; | 53 | Zavrtanik, M; |
