Positron Annihilation and Constant Photocurrent Method Measurements on A-Si : H Films: A Comparative Approach to Defect Identification

AuthID
 P-004-C5G
8
Author(s)
de Lima, AP
·
Tipo de Documento
Article
Year published
2007
Publicado
in RADIATION PHYSICS AND CHEMISTRY, ISSN: 0969-806X
Volume: 76, Número: 2, Páginas: 220-223 (4)
Conference
8Th International Workshop on Positron and Positronium Chemistry (Ppc-8), Date: SEP 04-09, 2005, Location: Coimbra, PORTUGAL
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Publication Identifiers
SCOPUS: 2-s2.0-33751195513
Wos: WOS:000242919200034
Source Identifiers
ISSN: 0969-806X
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