Publicações

Single Event Upset in Sram-Based Field Programmable Analog Arrays: Effects and Mitigation

AuthID
P-004-DEE

Author(s)

Balen, TR

Kastensmidt, FL

Lubaszewski, MS

Renovell, M

Editor(es)

Becker, J; Reis, R

Tipo de Documento

Proceedings Paper

Year published

2007

Publicado

in IEEE COMPUTER SOCIETY ANNUAL SYMPOSIUM ON VLSI, PROCEEDINGS: EMERGING VLSI TECHNOLOGIES AND ARCHITECTURES in IEEE Computer Society Annual on VLSI, ISSN: 2159-3477

Páginas: 192-197 (6)

Conference

Ieee-Computer-Society Annual Symposium on Vlsi, Date: MAR 08-11, 2007, Location: Porto Alegre, BRAZIL, Patrocinadores: IEEE Comp Soc, TC VLSI, Brazilian Comp Soc

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