A Pattern Recognition System Based on Cluster and Discriminant Analysis for Fault Identification During Production

AuthID
 P-004-F31
4
Author(s)
Tipo de Documento
Proceedings Paper
Year published
2007
Publicado
in 2007 IEEE INTERNATIONAL SYMPOSIUM ON INDUSTRIAL ELECTRONICS, PROCEEDINGS, VOLS 1-8
Páginas: 298-303 (6)
Conference
Ieee International Symposium on Industrial Electronics, Date: JUN 04-07, 2007, Location: Vigo, SPAIN, Patrocinadores: IEEE
Indexing
Wos®
Scopus®
Crossref®
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-50049128940
Wos: WOS:000252265100053
Export Publication Metadata
Lista Marked
 Adicionar à lista Marked
Info
At this moment we don't have any links to full text documens.

Um espaço para investigadores e suas Instituições

Links Úteis

Ajuda

© 2024 CRACS & Inesc TEC - All Rights Reserved Política de Privacidade | Terms of Service