The Effect of Charge Collection Recovery in Silicon P-N Junction Detectors Irradiated by Different Particles

AuthID
P-000-EE8
58
Author(s)
Verbitskaya, E
·
Anbinderis, P
·
Anbinderis, T
·
D'Ambrosio, N
·
de Boer, W
·
[+8]·
[+9]·
[+2]·
[+2]·
[+3]·
[+2]·
[+12]·
Sousa, P
·
Tuominen, E
·
da Via, C
·
Zavrtanik, M
1
Group Author(s)
RD39 Collaboration
1
Editor(es)
Borchi E.Bruzzi M.
Tipo de Documento
Article
Year published
2003
Publicado
in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, ISSN: 0168-9002
Volume: 514, Número: 1-3, Páginas: 47-61 (15)
Conference
4Th International Conference on Radiation Effects on Semiconductor Materials Detectors and Devices, Date: JUL 10-12, 2002, Location: FLORENCE, ITALY
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-0242523093
Wos: WOS:000186810500008
Source Identifiers
ISSN: 0168-9002
Export Publication Metadata
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Name Order Nome   Name Order Nome   Name Order Nome
1 Verbitskaya, E;   2 Abreu, M ;   3 Anbinderis, P;
4 Anbinderis, T;   5 D'Ambrosio, N;   6 de Boer, W;
7 Borchi, E;   8 Borer, K;   9 Bruzzi, M;
10 Buontempo, S;   11 Casagrande, L;   12 Chen, W;
13 Cindro, V;   14 Dezillie, B;   15 Dierlamm, A;
16 Eremin, V;   17 Gaubas, E;   18 Gorbatenko, V;
19 Granata, V;   20 Grigoriev, E;   21 Grohmann, S;
22 Hauler, F;   23 Heijne, E;   24 Heising, S;
25 Hempel, O;   26 Herzog, R;   27 Harkonen, J;
28 Ilyashenko, I;   29 Janos, S;   30 Jungermann, L;
31 Kalesinskas, V;   32 Kapturauskas, J;   33 Laiho, R;
34 Li, Z;   35 Mandic, I;   36 De Masi, R;
37 Menichelli, D;   38 Mikuz, M;   39 Militaru, O;
40 Niinikoski, TO;   41 O'Shea, V;   42 Pagano, S;
43 Palmieri, VG;   44 Paul, S;   45 Solano, BP;
46 Piotrzkowski, K;   47 Pirollo, S;   48 Pretzl, K;
49 Mendes, PR;   50 Ruggiero, G;   51 Smith, K;
52 Sonderegger, P;   53 Sousa, P;   54 Tuominen, E;
55 Vaitkus, J;   56 da Via, C;   57 Wobst, E;
58 Zavrtanik, M;