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Size Controlled Nano Meter Phase Structure in Thin Films of Blend Polythiophene Derivatives

AuthID
P-004-H5F

Author(s)

Cui, HN

Teixeira, V

Zhang, J

Lee, H

Tipo de Documento

Article

Year published

2006

Publicado

in THIN SOLID FILMS, ISSN: 0040-6090

Volume: 515, Número: 1, Páginas: 301-306 (6)

Conference

International Conference on Surfaces, Coatings and Nanostructured Materials (Nanosmat), Date: SEP 07-09, 2005, Location: Aveiro, PORTUGAL, Host: Univ Aveiro

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Publication Identifiers

DOI: 10.1016/j.tsf.2005.12.108

SCOPUS: 2-s2.0-33750018935

Wos: WOS:000240889400044

Source Identifiers

ISSN: 0040-6090

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Size Controlled Nano Meter Phase Structure in Thin Films of Blend Polythiophene Derivatives

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