Effect of Anti-Diffusion Oxide Layer on Enhanced Thermal Stability of Magnetic Tunnel Junctions

AuthID
 P-004-MC5
4
Author(s)
Zhang, ZZ
·
Zhao, H
·
Tipo de Documento
Article
Year published
2006
Publicado
in CHINESE PHYSICS LETTERS, ISSN: 0256-307X
Volume: 23, Número: 4, Páginas: 932-935 (4)
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Publication Identifiers
SCOPUS: 2-s2.0-33645543195
Wos: WOS:000236935000047
Source Identifiers
ISSN: 0256-307X
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