Oxide Muonics and the 3-Delta Model for Deep and Shallow Hydrogen States in Dielectric and Semiconducting Oxides

AuthID
 P-004-MK9
6
Author(s)
Cox, SFJ
·
Gavartin, JL
·
Lord, JS
·
Davis, EA
1
Editor(es)
Oshiyama A.Maeda K.Itoh K.M.Katayama-Yoshida H.
Tipo de Documento
Article
Year published
2006
Publicado
in PHYSICA B-CONDENSED MATTER, ISSN: 0921-4526
Volume: 376, Número: 1, Páginas: 385-388 (4)
Conference
23Rd International Conference on Defects in Semiconductors, Date: JUL 24-29, 2005, Location: Awaji Isl, JAPAN
Indexing
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Publication Identifiers
SCOPUS: 2-s2.0-33645231668
Wos: WOS:000237329500096
Source Identifiers
ISSN: 0921-4526
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