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Influence of the Ex-Situ and In-Situ Annealed Self-Buffer Layer on Zno Film

AuthID
P-004-QGB

Author(s)

Wang, JZ

Sallet, V

Amiri, G

Rommelluere, JF

Lusson, A

Rzepka, E

Lewis, JE

Galtier, P

Fortunato, E

Martins, R

Gorochov, O

Editor(es)

Stutzmann, M

Tipo de Documento

Proceedings Paper

Year published

2006

Publicado

in Physica Status Solidi C - Current Topics in Solid State Physics, Vol 3, No 4 in PHYSICA STATUS SOLIDI C-CURRENT TOPICS IN SOLID STATE PHYSICS, ISSN: 1610-1634

Volume: 3, Número: 4, Páginas: 1010-1013 (4)

Conference

12Th International Conference on Ii-Vi Compounds, Date: SEP 12-16, 2005, Location: Warsaw, POLAND

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Publication Identifiers

DOI: 10.1002/pssc.200564704

SCOPUS: 2-s2.0-33646242258

Wos: WOS:000236962100069

Source Identifiers

ISSN: 1610-1634

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Influence of the Ex-Situ and In-Situ Annealed Self-Buffer Layer on Zno Film

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Influence of the Ex-Situ and In-Situ Annealed Self-Buffer Layer on Zno Film

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