Non-Invasive Electrical Characterization of Semiconductor Interfaces

AuthID
 P-000-F5D
9
Author(s)
Vanderhaghen, R
·
Kasouit, S
·
Cho, HM
·
·
Lee, YW
·
Kim, HJ
·
Kim, SY
·
Kleider, JP
1
Editor(es)
Rosenwaks,Y
Tipo de Documento
Article
Year published
2003
Publicado
in MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, ISSN: 0921-5107
Volume: 102, Número: 1-3, Páginas: 156-160 (5)
Conference
Spring Meeting of the European-Materials-Research-Society (E-Mrs), Date: JUN 18-21, 2002, Location: STRASBOURG, FRANCE, Patrocinadores: European Mat Res Soc
Indexing
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Publication Identifiers
SCOPUS: 2-s2.0-0042012747
Wos: WOS:000185174800032
Source Identifiers
ISSN: 0921-5107
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