Fast Adc Testing by Repetitive Histogram Analysis

AuthID
 P-004-R1V
5
Author(s)
Michaeli, L
·
Michalko, P
·
Saliga, J
Tipo de Documento
Proceedings Paper
Year published
2006
Publicado
in 2006 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE PROCEEDINGS, VOLS 1-5 in IEEE Instrumentation and Measurement Technology Conference, ISSN: 1091-5281
Páginas: 1633-1638 (6)
Conference
23Rd Ieee Instrumentation and Measurement Technology Conference, Date: APR 24-27, 2006, Location: Sorrento, ITALY, Patrocinadores: IEEE Instrumentat & Measurement Soc
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Publication Identifiers
Wos: WOS:000244176703034
Source Identifiers
ISSN: 1091-5281
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