A Figure of Merit for the Evaluation of Long Term Memory Effects in Rf Power Amplifiers

AuthID
 P-004-R4W
3
Author(s)
Tipo de Documento
Proceedings Paper
Year published
2006
Publicado
in 2006 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-5 in IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, ISSN: 0149-645X
Páginas: 1109-1112 (4)
Conference
Ieee Mtt-S International Microwave Symposium, Date: JUN 11-16, 2006, Location: San Francisco, CA, Patrocinadores: IEEE MTTS
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Publication Identifiers
SCOPUS: 2-s2.0-33847747744
Wos: WOS:000244379002064
Source Identifiers
ISSN: 0149-645X
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