In Situ Infrared Spectroscopic Study of Atomic Layer-Deposited Tio2 Thin Films by Nonaqueous Routes

AuthID
 P-005-0RE
6
Author(s)
Tipo de Documento
Article
Year published
2013
Publicado
in CHEMISTRY OF MATERIALS, ISSN: 0897-4756
Volume: 25, Número: 9, Páginas: 1706-1712 (7)
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Publication Identifiers
SCOPUS: 2-s2.0-84877765521
Wos: WOS:000319184600033
Source Identifiers
ISSN: 0897-4756
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