Thickness Dependence of Structure and Piezoelectric Properties at Nanoscale of Polycrystalline Lead Zirconate Titanate Thin Films

AuthID
P-005-0RF
4
Author(s)
Araujo, EB
·
Lima, EC
·
Tipo de Documento
Article
Year published
2013
Publicado
in JOURNAL OF APPLIED PHYSICS, ISSN: 0021-8979
Volume: 113, Número: 18
Conference
21St Ieee International Symposium on Applications of Ferroelectrics Held Jointly with 11Th European Conference on the Applications of Polar Dielectrics and 4Th Conference on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials, Date: JUL 09-13, 2012, Location: Aveiro, PORTUGAL, Patrocinadores: IEEE, IEEE, Ultrason, Ferroelect & Frequency Control (UFFC) Soc, Host: Univ Aveiro
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-84878074968
Wos: WOS:000319294100112
Source Identifiers
ISSN: 0021-8979
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