Effects of Geometry Parameters of Ntfet Devices on the I-V Measurements

AuthID
 P-005-2PZ
5
Author(s)
Tipo de Documento
Article
Year published
2013
Publicado
in SOLID-STATE ELECTRONICS, ISSN: 0038-1101
Volume: 81, Páginas: 32-34 (3)
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Publication Identifiers
SCOPUS: 2-s2.0-84873355214
Wos: WOS:000317444400007
Source Identifiers
ISSN: 0038-1101
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