Thickness Measurement Using Transient Eddy Current Techniques

AuthID
 P-005-6M6
4
Author(s)
Smid, R
·
Tipo de Documento
Proceedings Paper
Year published
2011
Publicado
in 2011 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC) in IEEE Instrumentation and Measurement Technology Conference, ISSN: 1091-5281
Páginas: 138-143 (6)
Conference
Ieee International Instrumentation and Measurement Technology Conference (I2Mtc), Date: MAY 10-12, 2011, Location: Hangzhou, PEOPLES R CHINA, Patrocinadores: IEEE, IEEE Instrumentat & Measurement Soc, Zhejiang Univ
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Publication Identifiers
SCOPUS: 2-s2.0-80051907957
Wos: WOS:000297171900029
Source Identifiers
ISSN: 1091-5281
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