Elemental Thin Film Depth Profiles by Ion Beam Analysis Using Simulated Annealing - a New Tool

AuthID
P-000-H33
7
Author(s)
Marriott, PK
·
Boudreault, G
·
Jenkin, M
·
Webb, RP
Tipo de Documento
Review
Year published
2003
Publicado
in JOURNAL OF PHYSICS D-APPLIED PHYSICS, ISSN: 0022-3727
Volume: 36, Número: 7, Páginas: R97-R126 (30)
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-0345373827
Wos: WOS:000182586400001
Source Identifiers
ISSN: 0022-3727
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