In Situ Optical Reflectometry Applied to Growth of Indium Gallium Nitride Epilayers and Multi-Quantum Well Structures

AuthID
 P-000-HA0
8
Author(s)
Liu, C
·
Lada, M
·
Cullis, AG
·
Sun, YJ
·
Brandt, O
·
Tipo de Documento
Article
Year published
2003
Publicado
in SEMICONDUCTOR SCIENCE AND TECHNOLOGY, ISSN: 0268-1242
Volume: 18, Número: 4, Páginas: 212-218 (7)
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Publication Identifiers
SCOPUS: 2-s2.0-0037395715
Wos: WOS:000182640500008
Source Identifiers
ISSN: 0268-1242
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