Stress-Induced Suppression of Piezoelectric Properties in Pbtio3 : La Thin Films via Scanning Force Microscopy

AuthID
 P-000-HAN
6
Author(s)
Emelyanov, AY
·
Poyato, R
·
Calzada, ML
·
Pardo, L
Tipo de Documento
Article
Year published
2003
Publicado
in APPLIED PHYSICS LETTERS, ISSN: 0003-6951
Volume: 82, Número: 13, Páginas: 2127-2129 (3)
Indexing
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Scopus®
Crossref®52
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Publication Identifiers
SCOPUS: 2-s2.0-0037474954
Wos: WOS:000181801100044
Source Identifiers
ISSN: 0003-6951
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